You are here: Home / DIGIT-KEY / Setups / SEM/ESEM / SEM/ESEM FEI (MNCN-CSIC)

SEM/ESEM FEI (MNCN-CSIC)

         
-FEI INSPECT and FEI QUANTA 200, max resolution of 5nm (High Vacuum), 50nm (Low Vacuum) -source: X-Ray 5ev-30kV
Specialized training
Description

Ideally suitable for specimen up to 7cm diameter or max 10x10x5cm (LxWxH) and which can resist a pressure of 1 torr (in low ESEM vacuum).

It is used to study the sample at a superficial level, its micro-relief, its dimensions and morphometric characteristics. It is carried out in a NON-DESTRUCTIVE way (ESEM), without altering the nature of the sample.

Scanning Electron Microscopy Laboratory

Pipeline
Cost(s)
-Preparation time: it can be from several minutes to hours. Generally little preparation, since we try not to modify the sample at all. It just needs to be held tightly to microscopy stub. -Digitization procedure: place and hold the sample on the slides, and insert the sample in the SEM chamber. Therefore, adjusting the parameters of the electron beam, the voltage, the increases and the time required to focus the sample (greater magnifications required-longer time) -Analysis of images: Short processing time, only if you want to carry out measurements of the sample, or chemical analysis of the sample.
-Digitization procedure: scanning a sample can be done in a few minutes, but it can take several hours depending on the magnification used, and the details to be digitized. -Image analysis: Measurements, chemical analysis, taking general and detail images. It depends on the detail of examination of the specimen.
For detailed cost information please inquire.
Contents
Image PNG image FEI Quanta.png