SEM (RBGE)

Scanning electron microscope Zeiss Supra 55VP works with a field emission electron gun (FEG). This is the brightest type of electron source and gives the highest beam current and resolution capability. It also allow the observation at lower kV without the loss of detail. At RBGE, most of plant samples observed under 5 kV. The Supra has a variable pressure chamber as optional, allowing to observe semi conductive sample, though the dried and metal coated sample observation is our standard procedure.

The surface structure of delicate plant parts, such as pollen, seed, and epidermal hair structure can be observed in detail of resolution higher than 10 k magnification.

Size of objects

For the standard procedure, samples are glued on the surface of 12.5 mm diameter metal stub. The height is the lower the better, and it is approx. < 5 mm for standard samples. The flat surface is preferable since uneven surface causes the electric charging and interferes the observation.